CHABANE, Foued et al.
 Correlation with annealing temperature of pure and doped ZnO thin film.
<strong>Journal of Power Technologies</strong>, [S.l.], v. 93, n. 4, p. 202--206, june 2013.
ISSN 2083-4195.
Available at: &lt;<a href="https://papers.itc.pw.edu.pl/index.php/JPT/article/view/417" target="_new">https://papers.itc.pw.edu.pl/index.php/JPT/article/view/417</a>&gt;. Date accessed: 04 dec. 2024.